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Shielding efficiency and E(J) characteristics measured on large melt cast Bi-2212 hollow cylinders in axial magnetic fields

机译:在大熔体上测量的屏蔽效率和E(J)特性   在轴向磁场中铸造Bi-2212空心圆柱体

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摘要

We show that tubes of melt cast Bi-2212 used as current leads for LTS magnetscan also act as efficient magnetic shields. The magnetic screening propertiesunder an axial DC magnetic field are characterized at several temperaturesbelow the liquid nitrogen temperature (77 K). Two main shielding properties arestudied and compared with those of Bi-2223, a material that has been consideredin the past for bulk magnetic shields. The first property is related to themaximum magnetic flux density that can be screened, Blim; it is defined as theapplied magnetic flux density below which the field attenuation measured at thecentre of the shield exceeds 1000. For a cylinder of Bi-2212 with a wallthickness of 5 mm and a large ratio of length over radius, Blim is evaluated to1 T at T = 10 K. This value largely exceeds the Blim value measured at the sametemperature on similar tubes of Bi-2223. The second shielding property that ischaracterized is the dependence of Blim with respect to variations of the sweeprate of the applied field, dBapp/dt. This dependence is interpreted in terms ofthe power law E = Ec(J/Jc)^n and allows us to determine the exponent n of thisE(J) characteristics for Bi-2212. The characterization of the magnetic fieldrelaxation involves very small values of the electric field. This gives us theopportunity to experimentally determine the E(J) law in an unexplored region ofsmall electric fields. Combining these results with transport and AC shieldingmeasurements, we construct a piecewise E(J) law that spans over 8 orders ofmagnitude of the electric field.
机译:我们显示,用作LTS磁扫描的电流引线的Bi-2212熔铸管也可以用作有效的磁屏蔽。在低于液氮温度(77 K)的几个温度下表征了轴向DC磁场下的磁屏蔽性能。研究了两种主要的屏蔽性能,并将其与Bi-2223的性能进行了比较,Bi-2223是过去用于体磁屏蔽的一种材料。第一个属性与可以筛选的最大磁通密度Blim有关;它定义为应用的磁通密度,低于该值时,在屏蔽层中心测得的场衰减超过1000。对于壁厚为5 mm,长度与半径之比较大的Bi-2212圆柱体,Blim评估为T = 10K。该值大大超过了在相同温度下在Bi-2223的类似管上测得的Blim值。表征的第二种屏蔽特性是Blim对施加场的扫描速率dBapp / dt的变化的依赖性。这种依赖关系根据幂律E = Ec(J / Jc)^ n进行解释,并允许我们确定Bi-2212的E(J)特性的指数n。磁场松弛的表征涉及非常小的电场值。这使我们有机会在小电场的未探索区域中通过实验确定E(J)定律。将这些结果与传输和交流屏蔽测量相结合,我们构建了跨越电场8个数量级的分段E(J)定律。

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